【產(chǎn)品中文介紹】
YB4813半導體特性圖示儀是一款專業(yè)用于半導體器件特性分析的高精度測試設備。該儀器采用先進的測量技術，能夠精準捕捉二極管、晶體管、場效應管、可控硅等多種半導體元器件的電壓-電流（V-I）特性曲線，為研發(fā)、生產(chǎn)及質量控制環(huán)節(jié)提供可靠數(shù)據(jù)支持。
本設備集成多參數(shù)測試功能，支持靜態(tài)參數(shù)（如擊穿電壓、飽和電流）和動態(tài)特性（如跨導、輸出電容）的同步檢測，搭配智能化的圖形化操作界面，用戶可通過觸控屏幕直觀調整測試參數(shù)并實時觀測曲線變化。儀器內(nèi)置多種預置測試模式，支持自定義測試模板功能，顯著提升復雜器件的測試效率。
在硬件設計方面，YB4813采用模塊化架構，配備高穩(wěn)定性信號源與低噪聲采集系統(tǒng)，確保在寬量程范圍內(nèi)（電壓0-3kV/電流0-40A）仍能保持0.1%的基礎測量精度。獨特的溫漂補償技術有效降低環(huán)境溫度對測試結果的影響，滿足工業(yè)級實驗室對設備長期穩(wěn)定性的嚴苛要求。
該產(chǎn)品廣泛應用于半導體器件制造、電源模塊開發(fā)、新能源汽車電子系統(tǒng)檢測等領域，特別適用于第三代半導體材料（如SiC、GaN）器件的特性分析。設備支持數(shù)據(jù)導出與遠程控制功能，可無縫對接自動化測試系統(tǒng)，助力企業(yè)實現(xiàn)智能化產(chǎn)線升級。
我們致力于為客戶提供高性價比的測試解決方案，YB4813系列以優(yōu)異的性能表現(xiàn)和靈活的系統(tǒng)擴展能力，成為工程師進行半導體特性研究的理想工具。
【Product Introduction in English】
The YB4813 Semiconductor Curve Tracer is a precision testing instrument designed for comprehensive characterization of semiconductor devices. Utilizing cutting-edge measurement technology, it accurately captures voltage-current (V-I) characteristics of various components including diodes, transistors, MOSFETs, and thyristors, delivering reliable data support for R&D, manufacturing, and quality control processes.
Equipped with multi-parameter testing capabilities, this instrument enables simultaneous measurement of static parameters (breakdown voltage, saturation current) and dynamic characteristics (transconductance, output capacitance). The user-friendly touchscreen interface allows real-time curve observation and parameter adjustment, while pre-configured test modes and customizable templates significantly enhance testing efficiency for complex devices.
The YB4813 features a modular hardware architecture with high-stability signal sources and low-noise acquisition systems, achieving 0.1% baseline accuracy across wide measurement ranges (0-3kV voltage, 0-40A current). Its proprietary temperature drift compensation technology minimizes environmental impacts, ensuring consistent performance in industrial laboratory environments.
Ideal for semiconductor manufacturing, power module development, and automotive electronics validation, this instrument excels in analyzing wide-bandgap semiconductor materials (SiC, GaN). With data export and remote control capabilities, it seamlessly integrates into automated test systems, supporting smart factory initiatives.
Combining cost-effectiveness with operational flexibility, the YB4813 series offers engineers a powerful solution for advanced semiconductor research, backed by responsive technical support and adaptable system configurations to meet evolving industry demands.
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